The UA1780 enables high-quality test programs in a short period of time by using net information that has been reverse-generated from Gerber data and component information libraries, and delivers maximum performance when used in conjunction with Hioki’s new FA1240-50 flying probe tester.
• No need for camera-based teaching
• No need to visually trace patterns under components
• Easy generation of high-quality test data without boards
• Support for the new FA1240 data format